Lehighs Microscopy School, June 5-16, 2006

Lehigh’s scanning electron microscopy (SEM) courses were founded in 1970. More than three decades later, the Lehigh Microscopy School is widely recognized as the largest and best in the world.

	Click on the Lehigh Microscopy School logo to learn more about the upcoming session.

The next set of courses, set for June 5-16, are designed for individuals who use scanning electron microscopy and x-ray microanalysis in academic, governmental, or industrial laboratories: engineers, technicians, physical and biological scientists, clinicians, forensic scientists and technical managers.
For more information, check out the Lehigh Microscopy School Web site.